ディープサブミクロンCMOS論理回路内断線故障の電気的検査法に関する研究

トップ›研究者を探す›ディープサブミクロンCMOS論理回路内断線故障の電気的検査法に関する研究

ディープサブミクロンCMOS論理回路内断線故障の電気的検査法に関する研究

代表研究者	橋爪正樹
研究課題番号	KAKENHI-PROJECT-15500041
研究種目	基盤研究(C)
研究分野	総合・新領域系総合領域情報学計算機システム・ネットワーク
研究機関	徳島大学
研究期間開始年月日	2003/4/1
研究期間終了年度	2005
研究ステータス	完了 (2005/4/1)
配分額（合計）	2,900,000 (直接経費 :2,900,000)
配分額（履歴）	2005年度：900,000 (直接経費 :900,000) 2004年度：1,000,000 (直接経費 :1,000,000) 2003年度：1,000,000 (直接経費 :1,000,000)
キーワード	電気的検査 CMOS 断線故障リード浮き電流テスト IDDQテスト CMOS論理回路ピン浮き electrical test CMOS supply current open defect lead open current test

研究成果

[雑誌論文] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC voltage Signal Application

M.Hashizume 2006

[雑誌論文] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application

M.Hashizume 2006

[雑誌論文] Open Leads Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application

M.Hashizume 2006

[雑誌論文] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing

M.Hashizume 2005

[雑誌論文] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing

M.Hashizume 2005

[雑誌論文] Vectorless Open Pin Detection Method for CMOS Logic Circuits

M.Hashizume 2005

[雑誌論文] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing

M.Hashizume 2005

[雑誌論文] Vectorless Open Pin Detection Method for CMOS Logic Circuits

M.Hashizume 2005

[雑誌論文] Vectorless Open Pin Detection Method for CMOS Logic Circuits

M.Hashizume 2005

[雑誌論文] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing

M.Hashizume 2005

[雑誌論文] Vectorless Open Pin Detection Method for Logic Circuits

M.Hashizume 2005

[雑誌論文] Current Testable Design of Register String DACs

M.Hashizume 2005

[雑誌論文] Current Testable Design of Register String DACs

M.Hashizume 2005

[雑誌論文] Current Testable Design of Register String DACs

M.Hashizume 2005

[雑誌論文] Identification and Frequency estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits

M.Hashizume 2004

[雑誌論文] CMOS Open Fault Detection by Appearance Time of Switching Supply Current

M.Hashizume 2004

[雑誌論文] IDDQ Test method Based on Wavelet Transformation for Noisy Current Measurement Environment

M.Hashizume 2004

[雑誌論文] Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application

M.Hashizume 2004

[雑誌論文] IDDQ Test method Based on Wavelet Transformation for Noisy Current Measurement Environment

M.Hashizume 2004

[雑誌論文] Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application

M.Hashizume 2004

[雑誌論文] CMOS Open Fault Detection by Appearance Time of Switching Supply Current

M.Hashizume 2004

[雑誌論文] IDDQ Test Method Based on Wavalet Transformation for Noisy Current Measurement Environment

M.Hashizume 2004

[雑誌論文] Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits

M.Hashizume 2004

[雑誌論文] CMOS Open Fault Detection by Appearance Time of Switching Supply Current

M.Hashizume 2004

[雑誌論文] A BIST Circuit for IDDQ Tests

M.Hashizume 2003

[雑誌論文] Testability of Supply Current Test in an AGC

M.Hashizume 2003

[雑誌論文] Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits

M.Hashizume 2003

[雑誌論文] Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits

M.Hashizume 2003

[雑誌論文] Testability of Supply Current Test in an AGC

M.Hashizume 2003

[雑誌論文] A Supply Current Test Method for Bridging Faults in CMOS Microprocessor Based Circuits

M.Hashizume 2003